Karl Hirschman

2010 Submissions

Published Article

McCabe, Andrew M., Robert G. Manley, J.G. Couillard, C.A. Kosik Williams, and K.D. Hirschman. “High Field Induced Stress Suppression of GIDL Effects in Accumulation-Mode P Channel TFTs.” ECS Transactions, 33.5 (2010): 95-103. Web. † ≠*

Rettmann, Ryan D., J.G. Couillard, and K.D. Hirschman. “Characterization of Silicon-on-Glass Substrates using Variable Angle Spectroscopic Ellipsometry.” ECS Transactions, 33.5 (2010): 135-142. Web. † ≠*

Formal Presentation

Veeramachaneni, Bharat, J.D. Winans, S. Hu, D. Kawamura, P.M. Fauchet, K. Witt, and K.D. Hirschman. “A Novel Technique for Localized Formation of SOI Active Regions.” Porous Semiconductors - Science and Technology (PSST-2010) 7th International Conference. 14- 19 March 2010. Presentation. †