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RESEARCH AND TEACHING EXPERTISE
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Epitaxial Crystal Growth by Metalorganic Chemial Vapor Deposition
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Semiconductor Device Design and Fabrication
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Thin-Film Characterization Techniques
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MOCVD System Design
PRINCIPLE RESEARCH
- Nano-structures (quantum wires/dots) for enhanced efficiency photovoltaic cells.
- Growth of semiconductor nanostructures using MOCVD growth techniques
- Novel Approaches to Power Conversion (alphavoltaics, thin-film III-Vs)
- Wide-bandgap nanostructured gas sensors
- Nanostructured GaN using wet chemical etching
RECENT PUBLICATIONS
- S.M. Hubbard, D. Wilt, S. Bailey, D. Byrnes, R. Raffaelle, "OMVPE Grown InAs Quantum Dots for Application in Nanostructured Photovoltaics", Proc. of the IEEE World Conference on Photovoltaic Energy Conversion, 2006.
- S.M. Hubbard, "Metalorganic Vapor Phase Epitaxy (MOVPE) Growth and Characterization of III-Nitride Heterostructures for Application in Electronic Devices", Ph.D. Thesis, University of Michigan, 2005.
- S.M. Hubbard, G. Zhao, D. Pavlidis, W. Sutton, E. Cho, "High Resistivity GaN Buffer Templates and their Optimization for GaN-Based HFETs", J. Crystal Growth 284, 297-305 (2005).
- S.M. Hubbard, G. Zhao, D. Pavlidis, W. Sutton, E. Cho, "Optimization of GaN Channel Conductivity in AlGaN/GaN HFET Structures Grown by OMVPE", Mater. Res. Soc. Symp. Proc. 831, E11.11.1 (2004).
- G. Zhao, S.M. Hubbard, D. Pavlidis, "Yellow Luminescence Centers of GaN", Jap. J. Appl. Phys. 43, 2471-2472 (2004).
- S.M. Hubbard, D. Pavlidis, V. Valiaev, A. Eisenbach, "Metal-Organic Vapor Phase Epitaxy Growth and Characterization of AlN/GaN Heterostructures", J. Elect. Mat. 31, 395-401 (2002).
- S.M. Hubbard, D. Pavlidis, V. Valiaev, M.A. Stevens-Kalceff, I.M. Tiginyanu, "Electrical characterization and cathodoluminescence microanalysis of AlN/GaN heterostructures", Mat. Sci. Eng. B, B91-92, 336-340 (2002).
- D. Cui and S.M. Hubbard, D. Pavlidis, A. Eisenbach, C. Chelli, "Impact of doping and MOCVD conditions on minority carrier lifetime of zinc- and carbon-doped InGaAs and its applications to zinc- and carbon-doped InP/InGaAs heterostructure bipolar transistors", Semicond. Sci. Technol. 17, 503-509 (2002).
- S. Mohammadi, S.M. Hubbard, C. Chelli, D. Pavlidis, B. Bayraktaroglu, "Photoluminescence and transmission electron microscope studies of low- and high-reliability AlGaAs/GaAs HBTs", Solid-State-Electronics 44, 739-46 (2000).
- S.M. Hubbard, M. Tabib-Azar, C.M. Schnabel, S. Bailey, "Mapping of crystal defects and the minority carrier diffusion length in 6H-SiC using a novel electron beam induced current technique", J. Appl. Phys. 84, 3986-92 (1998).
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