Materials Characterization and Electron Microscopy
This facility contains equipment that is directed towards the imaging and fundamental characterization of the nanomaterials manufactured and used in all of the labs. This facility contains several microscopes including a Hitachi S-900 High Resolution Near Field FE-SEM, Zeiss Digital Microscopic Imaging System, a Nikon digital Nomarski microscope, and a FEI Phillips XL30 ESEM with a PGT IMIX X-ray Microanalysis System. A variety of spectrometers are available for use including a Perkin Elmer Lamda 900 UV-Vis-NIR optical spectrometer, Multi-wavelength Jobin Yvon Horriba LabRAM HR Raman Microscope and Photoluminescence spectrometer, and Jobin Yvon Horriba Fluorolog fluorescnent mapping spectrometer., and Photoluminescence Spectrometer.
In addition, basic testing of nanomaterials electrical properties can be accomplished using DLTS and Hall Effect Systems.