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The John D. Hromi Center for Quality and Applied Statistics

Technical Reports

TR#	Author(s)	Title
1999-1	J. G. Voelkel	Sequential Experimental Designs For Sensitivity Experiments
2004-1	J. G. Voelkel	The Efficiencies of Fractional Factorial Designs
2004-2	J. G. Voelkel	What is 3.4 Parts Per Million?
2004-3	P. Bajorski, E. J. Ientilucci, and J. R. Schott	Comparison of Basis-Vector Selection Methods for Target and Background Subspaces as Applied to Subpixel Target Detection
2004-4	P. Bajorski	Simplex Projection Methods for Selection of Endmembers in Hyperspectral Imagery
2004-5	P. Bajorski and E. J. Ientilucci	Geometric Basis-Vector Selection Methods and Subpixel Target Detection as Applied to Hyperspectral Imagery
2004-6	J. G. Voelkel	The APD Method of Understanding Variances and Expected Mean Squares
2005-1	P. Bajorski	Stepwise Simplex Projection Method for Selection of Endmembers in Hyperspectral Images
2005-2	P. Bajorski	Analytical Comparison of Subpixel Target Detectors in Structured Models for Hyperspectral Images
2005-3	J. G. Voelkel and B. E. Siskowski	A Study of the Bland-Altman Plot and its Associated Methodology
2005-4	P. Bajorski	Impact of Material Abundances Distributions on Detection Power in Hyperspectral Images
2005-5	P. Bajorski	Analytical Treatment of Detection Power in Simulated Hyperspectral Images
2005-6	J. G. Voelkel	An Introduction to R for Windows (MS Word format) Introduction to R .zip file
2005-7	P. Bajorski	Analytical Comparison of the Matched Filter and Orthogonal Subspace Projection Detectors in Structured Models for Hyperspectral Images
2006-1	J. G. Voelkel	Local-Functional Analysis of Variance for Process Models, Mixture Models, and Deterministic Systems
2006-2	P. Bajorski and E. J. Ientilucci	Statistical Models for Physically Derived Target Sub-Spaces
2006-3	P. Bajorski	Application of Nonnegative Principal Component Analysis in Hyperspectral Imaging
2006-4	A. E. Wyse and D. R. Lawrence	Combining Successive-Categories (Rating) Data And Dichotomous Incidence Data: A Forced Classification Procedure for Dual Scaling