Sorry, you need to enable JavaScript to visit this website.

Site-wide links

Reducing Variation with SPC

Statistical Process Control (SPC) provides the means for the control of product quality and the reduction of process variation. For success you need to know how to collect data, understand the concepts of variation, select the appropriate chart for your process and interpret the results. This seminar also shows participants how to use MINITAB® to create the charts.

Topics Include:

  • Variability and randomness
  • Definition of “process”
  • Process capability
  • Central Limit Theorem
  • Normal and binomial distributions
  • Special cause and assignable cause variation
  • X and R charts, plus I/MR charts for individual observations
  • P, np, c and u charts
  • SPC using MINITAB®

Pricing

$350 per person

Date

April 15, 2015 8:30 am - 4:30 pm

Registration

Seminar registration will be confirmed upon receipt of a sufficient number of registrations.

Please Note: Registration must be received at least one week prior to the beginning of the training program.

Registration is also available by contacting:

Susan Chapman
PHONE: (585) 475-6990
FAX: (585) 475-5959
E-MAIL: sjcpph@rit.edu

REGISTRATION FORM

PAY NOW
 

For more information, Contact:

Greg Evershed
Director of Business Development
gmecqa@rit.edu
585-475-5442
HLC/2526

  Rochester Institute of Technology
One Lomb Memorial Drive,
Rochester, NY 14623-5603
Copyright © Rochester Institute of Technology, All Rights Reserved. | Disclaimer | Copyright Infringement