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Center for Quality and Applied Statistics

Reducing Variation with SPC

Statistical Process Control (SPC) provides the means for the control of product quality and the reduction of process variation. For success you need to know how to collect data, understand the concepts of variation, select the appropriate chart for your process and interpret the results. This seminar also shows participants how to use MINITAB® to create the charts.

Topics Include:

  • Variability and randomness
  • Definition of “process”
  • Process capability
  • Central Limit Theorem
  • Normal and binomial distributions
  • Special cause and assignable cause variation
  • X and R charts, plus I/MR charts for individual observations
  • P, np, c and u charts
  • SPC using MINITAB®

COST: Contact Greg Evershed, Director of Business, at 585-475-5442 or greg.evershed@rit.edu. Continental breakfast and lunch is included each day of the seminar.

  Rochester Institute of Technology
One Lomb Memorial Drive,
Rochester, NY 14623-5603
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