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The Center for Detectors (CfD) was established in 2010 to design, develop, and implement new advanced sensor technologies through partnerships with academic researchers, industry engineers, government scientists, and university students. It is located in an approximately 5,000 sq. ft. space in the IT Collaboratory and houses offices and two labs, the Rochester Imaging Detector Laboratory and the Quantum Dot Detector Laboratory. The laboratories contain special equipment dedicated to the development of detectors.

Capabilities

In addition to fabrication and testing capabilities, the CfD has access to sophisticated simulation software to predict the performance of devices, from fabrication processes to performance of a completed detector. Simulations can describe all of the processes available in the RIT Semiconductor and Microsystems Fabrication Laboratory (SMFL) by building a physics-based model in 3D space of a device from initial substrate to completed device. The CfD also has the capability to simulate performance by deriving current-voltage, photovoltaic, charge distribution, point spread function, and quantum efficiency (both internal and external) characteristics through user-defined operating conditions.

Equipment

The CfD facilities include a permanent clean room, ESD stations, vacuum pumping systems, optical benches, flow tables, light sources, UV-IR monochromators, thermal control systems, cryogenic motion control systems, power supplies, general lab electronics, and data reduction PCs. The equipment is capable of analyzing both analog and digital signals. Separate rooms in the CfD are devoted to electrical rework and laser experiments.

Some of the equipment that is housed in the CfD includes:

• Cylindrical vacuum cryogenic dewars

• Calibrated lighting with illumination in ultraviolet and infrared spectrums

• Lakeshore Model 340 temperature controllers

• Astronomical research cameras

• Teledyne SIDECAR ASICs

• Custom FPGA systems

• Pico Quant laser

• Monochromators with an approximate wavelength range of 250 nm – 2500 nm

• NIST-traceable calibrated photodiodes with a wavelength range of 300 nm – 1100 nm

• Spot projector

• Custom software running automated detector test suite

• CAD software

• Class 1000 cleanroom (located in the SMFL)

• Probe station

• Amray 1830 scanning electron microscope

• WYKO white light interferometer

• Material layer thickness, refractive index, and wafer stress characterization tools

In addition to these dedicated facilities, the CfD has access to 10,000 sq. ft. of cleanroom facilities within the SMFL and other areas across the RIT campus, enabling the fabrication of detectors with custom process flows.

Contacts

For assistance or more information, please contact:

Don Figer, Ph.D., Director

Email: This e-mail address is being protected from spambots. You need JavaScript enabled to view it

Phone: 585-475-6005