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DTSTAMP:20240730T154728Z
SUMMARY:Imaging Science Thesis Defense: On the Optimization of Sensors
 for the Remote Sensing of Crop Yield
DTSTART:20240830T130000Z
DTEND:20240830T150000Z
LOCATION:Chester F. Carlson Center for Imaging Science: 3125
DESCRIPTION:<p class="default-image-margins"><span
 style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><b><span
 style="font-family:&quot;Arial&quot;,sans-serif">Imaging Science Thesis
 Defense</span></b></span></span><br>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><b><span
 style="font-size:16.0pt"><span
 style="font-family:&quot;Arial&quot;,sans-serif">On the Optimization of
 Sensors for the Remote Sensing of Crop
 Yield</span></span></b></span></span><br>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><b><span
 style="font-family:&quot;Arial&quot;,sans-serif"><span
 style="color:#ed7d31"><br>
 Nate Burglewski</span></span></b></span></span><br>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><span
 style="font-family:&quot;Arial&quot;,sans-serif">Imaging
 Science</span></span></span><br>
 <span style="font-size:11pt"><span style="tab-stops:199.3pt"><span
 style="font-family:Calibri,sans-serif"><span
 style="font-family:&quot;Arial&quot;,sans-serif">Rochester Institute of
 Technology&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nb
 sp; </span></span></span></span></p>
 <p class="default-image-margins"><span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><span class="MsoHyperlink"
 style="color:#0563c1"><span style="text-decoration:underline"><span
 style="font-family:&quot;Arial&quot;,sans-serif"><a
 href="https://rit.zoom.us/meeting/register/tJYqfumvpjstGNUYIpyrlM6dUUOowv
 kERp-0" style="color:#0563c1; text-decoration:underline">Register for
 Zoom Link Here</a></span></span></span></span></span><br>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><i><span
 style="font-family:&quot;Arial&quot;,sans-serif"><br>
 Abstract</span></i><span
 style="font-family:&quot;Arial&quot;,sans-serif">:</span></span></span><b
 r>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><span
 style="font-family:&quot;Arial&quot;,sans-serif">Remote sensing has long
 been a part of precision agriculture research, with products related to
 spatially-explicit, within-field management of yield, disease, and
 harvest scheduling, to name a few application areas that are of interest
 to industry. These spaceborne, airborne, and in-situ sensors are used to
 monitor crop health throughout the growing season, inform management
 decisions for farmers, and dictate logistical or planning operations.
 Crop yield forecasting, specifically, comes in many forms, but recently
 machine learning algorithms have gained prominence, at the cost of more
 traditional parametric regression models. While much work has been
 accomplished towards grain yield estimation using remote sensing data,
 silage yield forecasting has been less investigated. Furthermore, to date
 no sensor has been designed to optimize the spatial-spectral trade space
 that is relevant to yield estimation. We thus sought to identify the
 ideal spectral and spatial sampling parameters for a sensor to be used
 for this purpose. We first set out to identify a yield estimation
 algorithm which was favorable for both grain and silage yield, finding
 that support vector regression performed best at both field-level and
 regional yield estimates for corn grain. We then leveraged three separate
 spectral band selection algorithms to quantitatively assess the most
 important spectral content found in our high spatial resolution, high
 spectral dimensional imaging spectroscopy data. These data were resampled
 both spectrally and spatially to determine the interplay of spatial
 resolution and spectral content on corn grain and silage yield estimation
 results. Corn grain yield estimation accuracies ranged from 7.02% mean
 absolute percentage error (MAPE) (root mean square error [RMSE] = 0.332
 Mg/ha) at 0.06 m GSD to 11.45% MAPE (RMSE = 0.435 Mg/ha) at 30 m GSD
 using data collected at the same five band multispectral sampling
 configuration during the R4 (dough) growth stage. We found that this
 favorability extended to silage yield estimation at the same growth
 stage, with MAPE ranging from 2.22-2.84% MAPE (0.62-0.68 Mg/ha) from
 0.06-30 m GSD. </span></span></span><br>
 <span style="font-size:11pt"><span
 style="font-family:Calibri,sans-serif"><span
 style="font-family:&quot;Arial&quot;,sans-serif">We thus were able to
 identify the spectral features which were ideal for this purpose using
 high resolution imaging spectroscopy data, while also investigating the
 changes in estimation accuracies as a function of spectral content and
 spatial resolution. Ultimately, the most favorable spectral configuration
 was multispectral, containing blue (450 nm), green (550 nm), red (670),
 and three near-infrared spectral bands (770, 830, and 920 nm). This
 arguably is an ideal outcome, as sampling spectral content along these
 bandpasses greatly reduces dimensionality resulting from imaging
 spectroscopy data, while preserving the most important features for a
 machine learning regression algorithm to exploit. This spectral
 configuration was found to give the most accurate regression results,
 specifically centered at 8 -16 m GSDs for corn silage yield, even though
 there were changes in accuracy across a wide range of spatial
 resolutions. We attributed this result to matching the semivariance range
 of the yield data, which in turn generated favorable modeling conditions
 for the support vector regression estimation. For corn grain, the average
 semivariance range was greater than our largest sampling distance, so in
 general the higher spatial resolutions below 1 m GSD were most accurate.
 These findings inform sensor engineers of the optimal spectral sampling
 configuration for an idealized sensor for use in corn grain or silage
 yield estimation at any spatial scale. Future work should address the
 underlying yield drivers behind these selections to further isolate the
 spectral content correlated to crop health and status metrics like
 nitrogen content, heat stress, water stress, and structural parameters.
 These are all correlated with yield and thus important to stakeholders,
 leading to potential mitigation via management techniques to improve
 yield projections.<br>
 &nbsp;&nbsp; </span></span></span><br>
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