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Microelectronics Test and Characterization (MTC) Laboratory

Location
ENG/1515

This laboratory supports the electrical and mechanical characterization of semiconductor devices for educational and research purposes through wafer level probing and testing of discrete packaged parts. The lab contains multiple semi-automatic wafer probers with probe cards and cameras as well as manual probe stations. Test instrumentation includes Agilent Semiconductor Parameter Analyzers, oscilloscopes, power supplies, capacitance meters, network analyzers and the associated control software (ICS Metrics). The lab also houses the Micro-Electro-Mechanical Systems (MEMS) packaging and testing laboratory.

The lab contains multiple semi-automatic wafer probers with probe cards and cameras as well as manual probe stations. Test instrumentation includes Agilent Semiconductor Parameter Analyzers, oscilloscopes, power supplies, capacitance meters, network analyzers and the associated control software (ICS Metrics).

  Rochester Institute of Technology
One Lomb Memorial Drive,
Rochester, NY 14623-5603
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