Scott J. Anson, Ph.D., is an associate professor and serves as program chair for manufacturing engineering technology in the Manufacturing and Mechanical Engineering Technology/Packaging Science Department. Previously Anson was employed by Endicott Interconnect (formerly IBM) as an Advisory Engineer for Process Development and New Process Introduction. Anson brings over eight years of industry experience to RIT where he has been a faculty member for the past six years. His primary research focus is in electronics manufacturing: process development; failure analysis; and materials characterization. Technical subjects: soldering processes, lead free solder, wave soldering, reflow, Surface Mount Technology (SMT), reliability evaluation, new process introduction, applied statistics and design of experiments (DOE). Growth areas include general manufacturing process development and control, including design of experiments, manufacturing vitality and pedagogy in the aforementioned. Anson also serves as the Editor-in-Chief for the Journal of Applied Science and Engineering Technology. He is an active member of Surface Mount Technology Association (SMTA), advisor to RIT student chapter of SMTA, Society of Manufacturing Engineers (SME), Reviewer IEEE Transaction on Electronics Packaging Manufacturing Journal 2008-present, reviewer ASME InterPACK Conference 2009. Honors include:

1. Tau Beta Pi - National Engineering Honor Society
2. PI Tau Sigma - National Mechanical Engineering Honor Society
3. Alpha Pi Mu - National Industrial Engineering Honor Society
4. IBM Patent Disclosure forR "BGA Site Dressing Tool and Process" - 2003
5. IBM Corporate Technical Resource -- upper management tracked my salary and career progression
6. Nominated for a Richard and Virginia Eisenhart Provost's Award for Excellence in Teaching at RIT - 2005
7. Nominated for an Eisenhart Award for Outstanding Teaching at RIT - 2008
8. RIT College of Applied Science and Technology (CAST) Featured Scholar - 2009
9. "Principal Investigator Magnate" designation - RIT Sponsored Research Services - 2009