Publications

Selected Publications

  • Best Student Paper Award: J. O’Donnell, E. Greenfield, H. Hendy, K. Bergthold, C. Merkel, T. Das, "Evaluating FeFET and Memristor Performance in Time-Domain Computing Applications," IEEE Midwest Symposium on Circuits and Systems, Aug 2025
  • Best Paper Award: D. Zeznick, J. O'Donnell and T. Das, "A High-Efficiency LDO With Adaptive PSRR and Bandwidth Enhancements," 2025 23rd IEEE NEWCAS Conference, June 2025
  • S. Maru, M. Kost, E. King, Z. You, J. Wardlaw, X. Zhao and T. Das, “Inductive Sensing: A Phase Detector IC for Button Replacement in Mobile Devices,” IEEE International Symposium on Circuits and Systems (ISCAS), May 2025
  • R. Ranganatham, R. Ramos-Brito and T. Das, “An All Analog Temporal Power-Supply Trojan to Subvert ECG Biometric Authentication,” IEEE International Symposium on Circuits and Systems (ISCAS), May 2025
  • K. Bergthold, H. Hendy, E. Greenfield, C. Merkel, and T. Das, “Throughput Optimization for Time-Domain Neuromorphic Computing,” IEEE Transactions on Circuits and Systems II, Mar 2025
  • W. Wright and T. Das, “A High-Efficiency Capacitor-less LDO with Adaptive Dynamic Range Extension for Biosensing Applications”, IEEE Midwest Symposium on Circuits and Systems, Aug 2024
  • R. Ranganatham and T. Das, “An analog payload trojan via power-supply harmonic coupling in front-end circuits”, IEEE NEWCAS Conference, June 2024
  • H. Hendy, K. Bergthold, T. Das, and C. Merkel, "Design Space Exploration of Memristor-based Delay Cells for Time-domain Neuromorphic Computing" IEEE International Symposium on Circuits and Systems, May 2024
  • K. Bergthold, H. Hendy, C. Merkel and T. Das, “Throughput Optimization for Time-Domain Neuromorphic Computing”, IEEE Midwest Symposium on Circuits and Systems, Aug 2024
  • T. Das, A. Gopalan, C. Washburn and P.R. Mukund, “Self-Calibration of Input-Match in R.F. Front-end Circuitry”, IEEE Transactions on Circuits and Systems
  • T. Das, A. Gopalan, C. Washburn and P.R. Mukund, “Towards Fault-tolerant RF front-ends”, Journal of Electronic Testing (JETTA)
  • J. Fukumoto, T. Das, J. Burleson, J.E. Moon and P.R. Mukund, “Impact of Asymmetric Metal Coverage on High Performance MOSFET Mismatch”, Journal of Solid-State Electronics