Next-generation optical devices for semiconductors wafer inspection, microsystems and photovoltaics will be the focus of Tech Tours: An Educational Series program. The event takes place 10 a.m.–6 p.m. Oct. 26 in Louise M. Slaughter Hall, rooms 2210-2240 at Rochester Institute of Technology.
Tech Tours is presented in conjunction with the Institute of Electrical and Electronic Engineers Electron Device Society of Western New York conference meeting taking place the same day. Both events are free and open to the public.
Tech Tours is an on-site educational seminar and workshop series that focuses on the latest technologies being developed for microscopy, imaging and metrology. The programs are designed for university faculty and students as well as industry research partners. Sponsored by Olympus America, this year’s event will feature semiconductor wafer inspection microscopes, laser measuring devices and software systems.
The regional Electron Device Society meeting is featuring several programs by senior researchers and technologists including Thuy Dao, engineer, Freescale Semiconductor Inc., and Akif Sultan from Global Foundries Inc. Dao will discuss “Tungsten Fill Through-Silicon Via Stress Characterization” at 1:10 p.m. Sultan’s presentation, “Optimization of Stress Liner interface Location to Improve Circuit Level Performance for DSL Device Architecture” begins at 3:20 p.m.
Tech Tours was organized by the RIT microelectronic engineering program. For more information or to register contact Santosh Kurinec, professor of microelectronic engineering at RIT, at 475-2927 or email@example.com