April 14, 2015

Newsmaker: Santosh Kurinec

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Santosh Kurinec, professor of microelectronic engineering, presented research at the Frontiers of Characterization and Metrology for Nanoelectronics Conference in Dresden, Germany, April 14-16 on "XRD/TEM/EELS Studies in Memory Device Structures" and "Terahertz time-domain spectroscopy for characterization of doping profiles in semiconductors."