April 14, 2015

Newsmaker: Santosh Kurinec

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Santosh Kurinec, professor of microelectronic engineering, and Karine Florent, graduate engineering student, presented a poster session at the Frontiers of Characterization & Metrology for Nanoelectronics Conference in Dresden, Germany, April 14-16 on "electron energy-loss spectroscopy analysis on MoS2 layers transferred in silicon."